Exclusion of impurity particles during grain growth in charged colloidal crystals

Langmuir

Volumn 27, Issue 22, 2011, Pages 13420-13427

  Yoshizawa, Koki ^a   Okuzono, Tohru ^a   Koga, Tsuyoshi ^b   Taniji, Tomohiro ^a   Yamanaka, Junpei ^a  

^a NAGOYA CITY UNIVERSITY   (Japan)

^b KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COLLOIDAL CRYSTALS; COLLOIDAL SILICA; CONFOCAL LASER SCANNING MICROSCOPY; GRAIN BOUNDARY MIGRATIONS; GRAIN GROWTH PROCESS; GRAIN SIZE; IMPURITY PARTICLES; PARTICLE VOLUME FRACTIONS; POWER-LAW GROWTH; RANDOMLY DISTRIBUTED; SILICA CRYSTALS; SILICA PARTICLES; TIME-RESOLVED;

COLLOIDS; CONFOCAL MICROSCOPY; CRYSTAL IMPURITIES; CRYSTALS; DISTRIBUTION FUNCTIONS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; POLYSTYRENES; SILICA; SIZE DISTRIBUTION;

GRAIN GROWTH;

ARTICLE; COLLOID; CONFOCAL MICROSCOPY; CRYSTALLIZATION; FLUORESCENCE; GEL MOBILITY SHIFT ASSAY;

COLLOIDS; CRYSTALLIZATION; ELECTROPHORETIC MOBILITY SHIFT ASSAY; FLUORESCENCE; MICROSCOPY, CONFOCAL;

EID: 80755159523     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la202899v     Document Type: Article

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