A nanoscale standard for the Seebeck coefficient

Nano Letters

Volumn 11, Issue 11, 2011, Pages 4679-4681

  Mani, Preeti ^a   Nakpathomkun, Natthapon ^a   Hoffmann, Eric A ^a   Linke, Heiner ^a  

^a UNIVERSITY OF OREGON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION STANDARD; DEVICE TEMPERATURE; ELECTRONIC CHARGES; KEY PARAMETERS; NANO SCALE; SINGLE-ELECTRON TUNNELING DEVICES; THERMOELECTRIC PERFORMANCE; TRANSMISSION RESONANCE;

ELECTRON TUNNELING; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; SEMICONDUCTOR QUANTUM DOTS; STANDARDS;

SEEBECK COEFFICIENT;

NANOMATERIAL; QUANTUM DOT;

ARTICLE; CHEMISTRY; ELECTROMAGNETIC FIELD; MATERIALS TESTING; METHODOLOGY; TEMPERATURE; ULTRASTRUCTURE;

ELECTROMAGNETIC FIELDS; MATERIALS TESTING; NANOSTRUCTURES; QUANTUM DOTS; TEMPERATURE;

EID: 80755125682     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl202258f     Document Type: Article

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