Spectroscopic ellipsometry of few-layer graphene

Journal of Nanophotonics

Volumn 5, Issue 1, 2011, Pages

  Isić, Goran ^a,b   Jakovljević, Milka ^a   Filipović, Marko ^a   Jovanović, Djordje M ^a   Vasić, Borislav ^a   Lazović, Saša ^a   Puač, Nevena ^a   Petrović, Zoran L ^a   Kostić, Radmila ^a   Gajić, Radoš ^a   Humlíček, Josef ^c   Losurdo, Maria ^d   Bruno, Giovanni ^d   Bergmair, Iris ^e   Hingerl, Kurt ^f  

^a UNIVERSITY OF BELGRADE   (Serbia)

^b UNIVERSITY OF LEEDS   (United Kingdom)

^c MASARYK UNIVERSITY   (Czech Republic)

^d UNIVERSITY OF BARI   (Italy)

^e PROFACTOR GMBH   (Austria)

^f JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

ellipsometry; graphene; island film model

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELLIPSOMETRY; OPTICAL PROPERTIES; SILICON ON INSULATOR TECHNOLOGY; SPECTROSCOPIC ELLIPSOMETRY;

ELLIPSOMETRIC DATA; ERROR MARGINS; FEW-LAYER GRAPHENE; ISLAND FILMS; SPECTROSCOPIC ELLIPSOMETERS; ULTRAVIOLET AND VISIBLE SPECTRUM;

GRAPHENE;

EID: 80655144815     PISSN: None     EISSN: 19342608     Source Type: Journal    
DOI: 10.1117/1.3598162     Document Type: Article

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