Combined atomic force microscopy-Raman mapping of electric field enhancement and surface-enhanced Raman scattering hot-spots for nanosphere lithography substrates

Journal of Nanophotonics

Volumn 5, Issue 1, 2011, Pages

  Sweetenham, Claire S ^a   Notingher, Ioan ^a  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

nanosphere lithography; Raman mapping; surface enhanced Raman spectroscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; LIGHT TRANSMISSION; LITHOGRAPHY; MAPPING; MONOLAYERS; NANOSPHERES; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SURFACE SCATTERING; TOPOGRAPHY;

ELECTRIC FIELD ENHANCEMENT; METALLIC NANOSTRUCTURE; NANO SPHERE LITHOGRAPHY; RAMAN MAPPING; RAMAN MICRO SPECTROSCOPY; SURFACE ENHANCED RAMAN SCATTERING (SERS); SURFACE ENHANCED RAMAN SPECTROSCOPY; THEORETICAL CALCULATIONS;

SUBSTRATES;

EID: 80655144802     PISSN: None     EISSN: 19342608     Source Type: Journal    
DOI: 10.1117/1.3595345     Document Type: Article

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