SCOPUS 정보 검색 플랫폼

Journal of Applied Physics

Volumn 110, Issue 8, 2011, Pages

Identification of graphene crystallographic orientation by atomic force microscopy

(4) Almeida, C M a Carozo, V a,b Prioli, R c Achete, C A a,b

a INSTITUTO NACIONAL DE METROLOGIA (Brazil)

b FEDERAL UNIVERSITY OF RIO DE JANEIRO (Brazil)

c PONTIFICAL CATHOLIC UNIVERSITY OF RIO DE JANEIRO (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE; CRYSTAL EDGES; CRYSTALLOGRAPHIC ORIENTATIONS; DIRECT DETERMINATION; GRAPHENE SHEETS; HEXAGONAL STRUCTURES; LATERAL FORCE; LATERAL FORCE MODES; LATTICE RESOLUTION; LATTICE SYMMETRY;

ATOMIC FORCE MICROSCOPY; CRYSTAL SYMMETRY; GRAPHENE; RAMAN SPECTROSCOPY; SILICON COMPOUNDS; VISUALIZATION;

CRYSTAL ORIENTATION;

EID: 80655141488 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3642991 Document Type: Article

Times cited : (20)

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