Improved diagnosis by combining structural and process knowledge

IEEE International Conference on Emerging Technologies and Factory Automation, ETFA

Volumn , Issue , 2011, Pages

  Christiansen, Lars ^a   Fay, Alexander ^a   Opgenoorth, Bernd ^b   Neidig, Jörg ^b  

^a HELMUT SCHMIDT UNIVERSITY   (Germany)

^b SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

A PLANTS; PROCESS KNOWLEDGE; PRODUCTION PROCESS; ROOT CAUSE; STRUCTURAL KNOWLEDGE; SUB-SYSTEMS; SYSTEM DIAGNOSIS;

FACTORY AUTOMATION;

FAULT DETECTION;

EID: 80655139091     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETFA.2011.6059056     Document Type: Conference Paper

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