Optical surface profilometry and AFM of Orb weaver spider silks

ICONN 2010 - Proceedings of the 2010 International Conference on Nanoscience and Nanotechnology

Volumn , Issue , 2010, Pages 222-224

  Kane, D M ^a   Staib, G R ^a,b   Naidoo, N ^a   Joyce, A M ^a   Rabeau, J R ^a   Herberstein, M E ^a  

^a MACQUARIE UNIVERSITY   (Australia)

^b GRIFFITH UNIVERSITY   (Australia)

Author keywords

AFM; Microscale topology; Nanoscale roughness; Optical surface profile; Spider silk; Surface topology

Indexed keywords

AFM; MICRO-SCALES; NANO-SCALE ROUGHNESS; OPTICAL SURFACE PROFILES; SPIDER SILKS; SURFACE TOPOLOGY;

ATOMIC FORCE MICROSCOPY; NANOSCIENCE; TOPOLOGY;

SILK;

EID: 80555124975     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICONN.2010.6045264     Document Type: Conference Paper

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