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Volumn , Issue , 2010, Pages 222-224
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Optical surface profilometry and AFM of Orb weaver spider silks
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Author keywords
AFM; Microscale topology; Nanoscale roughness; Optical surface profile; Spider silk; Surface topology
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Indexed keywords
AFM;
MICRO-SCALES;
NANO-SCALE ROUGHNESS;
OPTICAL SURFACE PROFILES;
SPIDER SILKS;
SURFACE TOPOLOGY;
ATOMIC FORCE MICROSCOPY;
NANOSCIENCE;
TOPOLOGY;
SILK;
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EID: 80555124975
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ICONN.2010.6045264 Document Type: Conference Paper |
Times cited : (3)
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References (13)
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