Broadband measurements of the transient optical complex dielectric function of a nanoparticle/polymer composite upon ultrafast excitation

Physical Review B - Condensed Matter and Materials Physics

Volumn 84, Issue 16, 2011, Pages

  Kiel, M ^a   Mohwald H ^b   Bargheer, M ^a,c  

^a UNIVERSITY OF POTSDAM   (Germany)

^b MAX PLANCK INSTITUTE OF COLLOIDS AND INTERFACES   (Germany)

^c Helmholtz Centre   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 80455177263     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.84.165121     Document Type: Article

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28. The formalism fully accounts for multiple reflections in plane-parallel layers, i.e., from the two sides of the effective medium. This is important, because the sample's surface roughness, which was measured by AFM to be about 2 nm, is about two orders of magnitude smaller than the wavelength of investigation, such that multiple reflections inside the sample layer add up coherently and contribute considerably.