High-accuracy three-dimensional position measurement of tens of micrometers size transparent microspheres using digital in-line holographic microscopy

Optics Letters

Volumn 36, Issue 21, 2011, Pages 4167-4169

  Choi, Yong Seok ^a   Lee, Sang Joon ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

3D POSITIONS; AXIAL ELONGATION; DEPTH OF FOCUS; HIGH-ACCURACY; HOLOGRAPHIC MICROSCOPY; IN-LINE; MEASUREMENT ACCURACY; MICROSCALE FLOWS; PROPAGATION DIRECTION; SPHERICAL PARTICLE; SUBMICROMETER RESOLUTION; THREE-DIMENSIONAL (3D); WAVEFIELDS;

MICROMETERS; POSITION MEASUREMENT; THREE DIMENSIONAL;

PARTICLE SIZE;

EID: 80455132270     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.36.004167     Document Type: Article

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