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Volumn , Issue 53, 2011, Pages
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Focussed ion beam milling and scanning electron microscopy of brain tissue
a
EPFL
(Switzerland)
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 80355132753
PISSN: 1940087X
EISSN: None
Source Type: Journal
DOI: 10.3791/2588 Document Type: Article |
Times cited : (98)
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References (3)
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