The speckle interferometry method for determining the thermal expansion of nanomaterials nanometrology

Measurement Techniques

Volumn 54, Issue 4, 2011, Pages 434-441

  Kompan, T A ^a   Korenev, A S ^a   Pukhov, N F ^a   Gurov, I P ^b   Dudina, T F ^b   Margaryants, N B ^b  

^a D I MENDELEYEV INSTITUTE FOR METROLOGY   (Russian Federation)

^b ITMO UNIVERSITY   (Russian Federation)

Author keywords

Nanomaterial; Speckle interferometer; Thermal expansion

Indexed keywords

FUNDAMENTAL PARAMETERS; NANOMATERIAL; NANOMETROLOGY; NON-CONTACT; OPTICAL ELECTRONICS; ROUGH SURFACES; SPECKLE INTERFEROMETER; SPECKLE INTERFEROMETRY;

EXPANSION; INTERFEROMETRY; MICHELSON INTERFEROMETERS; NANOSTRUCTURED MATERIALS; SPECKLE;

THERMAL EXPANSION;

EID: 80155188213     PISSN: 05431972     EISSN: 15738906     Source Type: Journal    
DOI: 10.1007/s11018-011-9744-6     Document Type: Article

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