Reduced auger recombination in mid-infrared semiconductor lasers

Journal of Applied Physics

Volumn 110, Issue 7, 2011, Pages

  Bedford, Robert G ^a   Triplett, Gregory ^b   Tomich, David H ^a   W Koch, Stephan ^c   Moloney, Jerome ^d   Hader, Jrg ^d  

^a AIR FORCE RESEARCH LABORATORY   (United States)

^b UNIVERSITY OF MISSOURI   (United States)

^c PHILIPPS UNIVERSITY MARBURG   (Germany)

^d NONLINEAR CONTROL STRATEGIES INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER CURRENT; AUGER RECOMBINATION; EDGE EMITTING LASERS; LIFETIME IMPROVEMENT; MIDINFRARED; QUANTUM WELL; ROOM TEMPERATURE;

AUGERS; CARRIER LIFETIME; INDIUM ANTIMONIDES; INFRARED LASERS;

QUANTUM WELL LASERS;

EID: 80055009961     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3646552     Document Type: Article

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