Imaging the formation of a p-n junction in a suspended carbon nanotube with scanning photocurrent microscopy

Journal of Applied Physics

Volumn 110, Issue 7, 2011, Pages

  Buchs, Gilles ^a   Barkelid, Maria ^a   Bagiante, Salvatore ^b   Steele, Gary A ^a   Zwiller, Val ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

GATE CONFIGURATION; I - V CURVE; IDEAL DIODES; IN-SITU; MICROSCOPIC STUDY; NANOTUBE AXIS; P-N JUNCTION; POTENTIAL PROFILES; SEMICONDUCTING CARBON NANOTUBES; SERIES RESISTOR; TRANSISTOR CHANNELS; TRANSPORT MEASUREMENTS;

SEMICONDUCTOR JUNCTIONS;

CARBON NANOTUBES;

EID: 80055002534     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3645022     Document Type: Article

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