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6
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0001121036
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B. Alperson, S. Cohen, I. Rubinstein, and G. Hodes, Phys. Rev. B 52, R17 017 (1995).
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(1995)
Phys. Rev. B
, vol.52
, pp. R17017
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Alperson, B.1
Cohen, S.2
Rubinstein, I.3
Hodes, G.4
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12
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85038907868
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unpublished
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M. Drndic, et al., (unpublished).
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Drndic, M.1
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13
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85038942837
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Other measurements, made on substrates with circular electrodes, are consistent with those shown here; for these devices, the active area of the film lies inside the outer electrode, and so the similarity of the results confirms this picture
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Other measurements, made on substrates with circular electrodes, are consistent with those shown here; for these devices, the active area of the film lies inside the outer electrode, and so the similarity of the results confirms this picture.
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-
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14
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85038924324
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-
A stretched exponential decay will always be concave downward on a log-log plot, although with (formula presented) the form approaches a straight line. Here we choose a characteristic time of (formula presented), an order of magnitude shorter than our earliest measurement time; longer values of (formula presented) would show still more curvature. In the data from the sandwich structures of Ref. 8, typical values of (formula presented) were 10-500 s
-
A stretched exponential decay will always be concave downward on a log-log plot, although with (formula presented) the form approaches a straight line. Here we choose a characteristic time of (formula presented), an order of magnitude shorter than our earliest measurement time; longer values of (formula presented) would show still more curvature. In the data from the sandwich structures of Ref. 8, typical values of (formula presented) were 10-500 s.
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-
-
-
15
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-
85038887192
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-
Although charge spreads into the film in all directions from the source electrode, the measured current arises only from charge which either passes into, or moves near to (relative to the thickness of the gate oxide), the drain electrode. More distant charge will be screened by the gate electrode, which is grounded for the measurement. Therefore, when estimating the possible contribution of stored charge to the measured current, we consider only the area of the film between the electrodes. Even if the entire surface of the substrate, except for the drain electrode, were charged to (formula presented) this measurement would be sensitive only to charge around the perimeter of the electrode, leading to a correction of less than a factor of 10
-
Although charge spreads into the film in all directions from the source electrode, the measured current arises only from charge which either passes into, or moves near to (relative to the thickness of the gate oxide), the drain electrode. More distant charge will be screened by the gate electrode, which is grounded for the measurement. Therefore, when estimating the possible contribution of stored charge to the measured current, we consider only the area of the film between the electrodes. Even if the entire surface of the substrate, except for the drain electrode, were charged to (formula presented) this measurement would be sensitive only to charge around the perimeter of the electrode, leading to a correction of less than a factor of 10.
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-
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16
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85038924919
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photoconductivity measurements on similar samples (Ref. 11), photocurrent several orders of magnitude larger than the dark current is observed. The spectral dependence of the photocurrent is the same as the optical absorption of the nanocrystals. In the measurements discussed here, the creation of electron-hole pairs in the nanocrystals apparently makes the CAS sufficiently conducting for the charge to return to ground
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In photoconductivity measurements on similar samples (Ref. 11), photocurrent several orders of magnitude larger than the dark current is observed. The spectral dependence of the photocurrent is the same as the optical absorption of the nanocrystals. In the measurements discussed here, the creation of electron-hole pairs in the nanocrystals apparently makes the CAS sufficiently conducting for the charge to return to ground.
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17
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0037025709
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W. Woo, et al., Adv. Mater. 14, 1068 (2002).
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(2002)
Adv. Mater.
, vol.14
, pp. 1068
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Woo, W.1
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18
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85038961293
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Here, we use the word scaling in the general sense: to say that the transients scale with the field is to say that (formula presented) depends only on (formula presented), where L is the sample length, rather than (formula presented)
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Here, we use the word scaling in the general sense: to say that the transients scale with the field is to say that (formula presented) depends only on (formula presented), where L is the sample length, rather than (formula presented).
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19
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0000106982
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D. Chepic, et al., J. Lumin. 47, 113 (1990).
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(1990)
J. Lumin.
, vol.47
, pp. 113
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Chepic, D.1
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20
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85038942167
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The exponential dependence of the amplitude of the current transients can be seen for low voltages on the gated substrates in Fig. 66, and is observed for all voltages for measurements on the quartz substrates (Ref. 12)
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The exponential dependence of the amplitude of the current transients can be seen for low voltages on the gated substrates in Fig. 66, and is observed for all voltages for measurements on the quartz substrates (Ref. 12).
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