PXRF, μ-XRF, vacuum μ-XRF, and EPMA analysis of email champlevé objects present in belgian museums

Microscopy and Microanalysis

Volumn 17, Issue 5, 2011, Pages 674-685

  Van Der Linden, Veerle ^a   Meesdom, Eva ^b   Devos, Annemie ^b   Van Dooren, Rita ^c   Nieuwdorp, Hans ^c   Janssen, Elsje ^d   Balace, Sophie ^e   Vekemans, Bart ^f   Vincze, Laszlo ^f   Janssens, Koen ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b Museum Vleeshuis   (Belgium)

^c Museum Mayer Van Den Bergh   (Belgium)

^d Hessenhuis ^*  (Belgium)

^e GHENT UNIVERSITY   (Belgium)

^f Koninklijke Musea voor Kunst en Geschiedenis (KMKG)   (Belgium)

Author keywords

XRF; archaeometry; Email Champlev ; enamel; EPMA; portable XRF; quantitative analysis; X ray fluorescence analysis

Indexed keywords

EID: 80054955465     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927611011950     Document Type: Article

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