Void and phase evolution during the processing of Bi-2212 superconducting wires monitored by combined fast synchrotron micro-tomography and x-ray diffraction

Superconductor Science and Technology

Volumn 24, Issue 11, 2011, Pages

  Scheuerlein, C ^a   Di Michiel, M ^b   Scheel, M ^b   Jiang, J ^c   Kametani, F ^c   Malagoli, A ^c,d   Hellstrom, E E ^c   Larbalestier, D C ^c  

^a CERN   (Switzerland)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c FLORIDA STATE UNIVERSITY   (United States)

^d CNR SPIN   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

BI-2201; BI-2212; BI-2212 ROUND WIRES; BUBBLE DENSITY; CURRENT FLOWS; DIFFRACTION STUDIES; EX SITU; FILAMENT DIAMETER; IMPURITY PHASE; IN-SITU; INHOMOGENEITIES; LIQUID STATE; MELT PROCESSING; MICRO-TOMOGRAPHY; MULTIPLE FILAMENT; NON DESTRUCTIVE; PHASE EVOLUTIONS; RESIDUAL POROSITY; ROOM TEMPERATURE; SPATIAL EXTENT; STARTING POWDERS; TOMOGRAPHIC;

AGGLOMERATION; COALESCENCE; DIFFRACTION; MELTING; POROSITY; SUPERCONDUCTING WIRE; SYNCHROTRONS; TOMOGRAPHY; X RAY DIFFRACTION;

WIRE;

EID: 80054906568     PISSN: 09532048     EISSN: 13616668     Source Type: Journal    
DOI: 10.1088/0953-2048/24/11/115004     Document Type: Article

References (24)

1. Weijers H W et al 2010 IEEE Trans. Supercond. 20 576-82
2. Godeke A et al 2010 Supercond. Sci. Technol. 23 034022
3. Godeke A, Cheng D W, Dietderich D R, Hannaford C R, Prestemon S O, Sabbi G, Wang X R, Hikichi Y, Nishioka J and Hasegawa T 2009 IEEE Trans. Appl. Supercond. 19 2228-31
4. Miao H et al 2005 IEEE Trans. Appl. Supercond. 15 2554
5. Shen T, Jiang J, Yamamoto A, Trociewitz U P, Schwartz J, Hellstrom E E and Larbalestier D C 2009 Appl. Phys. Lett. 95 152516
6. Shen T, Jiang J, Kametani F, Trociewitz U P, Larbalestier D C, Schwartz J and Hellstrom E E 2010 Supercond. Sci. Technol. 23 025009
7. Shen T et al 2011 Supercond. Sci. Technol. at press
8. Malagoli A, Kametani F, Jiang J, Trociewitz U P, Hellstrom E E and Larbalestier D C 2011 Supercond. Sci. Technol. 24 075016
9. Karuna M, Parrell J A and Larbalestier D C 1995 IEEE Trans. Supercond. 5 1279
10. Kametani F et al 2011 Supercond. Sci. Technol. 24 075009
11. Jiang J, Starch W L, Hannion M, Kametani F, Trociewitz U P, Hellstrom E E and Larbalestier D C 2011 Supercond. Sci. Technol. 24 082001
12. Di Michiel M, Merino J M, Fernandez-Carreiras D, Buslaps T, Honkimäki V, Falus P, Martins T and Svensson O 2005 Rev. Sci. Instrum. 76 043702
13. Scheuerlein C, Di Michiel M and Haibel A 2007 Appl. Phys. Lett. 90 132510
14. Scheuerlein C, Di Michiel M and Buta F 2009 IEEE Trans. Appl. Supercond. 19 2653-6
15. Ghosh A 2011 BNL private communication
16. Schmahl W W, Lehmann M, Raeth S, Gerards M and Riddle R 1998 Supercond. Sci. Technol. 11 1269-76
17. Zhang W and Hellstrom E E 1995 Supercond. Sci. Technol. 8 430
18. Zhang W and Hellstrom E E 1994 Physica C 234 137-45
19. Lang Th, Buhl D and Gauckler L J 1997 Physica C 275 284-92
20. Miao H, Marken K R, Meinesz M, Czabaj B, Hong S, Rikel M O and Bock J 2006 Adv. Cryog. Eng. 52B 673
21. Rikel M O et al 2006 J. Phys.: Conf. Ser. 43 51-4
22. Rikel M O 2011 private communication
23. Di Michiel M and Scheuerlein C 2007 Supercond. Sci. Technol. 20 L55-8
24. Heine K, Tenbrink J and Thoener M 1989 Appl. Phys. Lett. 55 2441-3