Voltage stability monitoring based on the concept of coupled single-port circuit

IEEE Transactions on Power Systems

Volumn 26, Issue 4, 2011, Pages 2154-2163

  Wang, Yunfei ^a   Pordanjani, Iraj Rahimi ^a   Li, Weixing ^b   Xu, Wilsun ^a   Chen, Tongwen ^a   Vaahedi, Ebrahim ^c   Gurney, Jim ^c  

^a UNIVERSITY OF ALBERTA   (Canada)

^b HARBIN INSTITUTE OF TECHNOLOGY   (China)

^c British Columbia Transmission Corporation   (Canada)

Author keywords

Impedance matching; load shedding; single port; Thevenin equivalent circuit; voltage stability margin

Indexed keywords

CIRCUIT PARAMETER; IMPEDANCE MATCH; LOAD-SHEDDING; MESHED NETWORKS; POWER SYSTEM LOADS; SINGLE BUS; SINGLE-PORT; SYSTEM-BASED; TEST SYSTEMS; THEVENIN EQUIVALENT CIRCUIT; VOLTAGE STABILITY LIMITS; VOLTAGE STABILITY MARGIN; VOLTAGE STABILITY MARGINS;

ELECTRIC LOAD SHEDDING; ELECTRIC NETWORK ANALYSIS; IMPEDANCE MATCHING (ELECTRIC); POWER TRANSMISSION; REACTIVE POWER; SYSTEM STABILITY; VOLTAGE STABILIZING CIRCUITS;

COUPLED CIRCUITS;

EID: 80054901075     PISSN: 08858950     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPWRS.2011.2154366     Document Type: Article

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