C4: Exploring multiple solutions in graphical models by cluster sampling

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 33, Issue 9, 2011, Pages 1713-1727

  Porway, Jacob ^a   Zhu, Song Chun ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

computer vision; constraint satisfaction; graph labeling; Markov random fields; Monte Carlo.; probabilistic algorithms

Indexed keywords

CONSTRAINT SATISFACTION; GRAPH LABELING; MARKOV RANDOM FIELDS; MONTE CARLO; PROBABILISTIC ALGORITHM;

CLUSTERING ALGORITHMS; COMPUTER VISION; GRAPHIC METHODS; HIERARCHICAL SYSTEMS; IMAGE SEGMENTATION; INFERENCE ENGINES; MARKOV PROCESSES; MONTE CARLO METHODS; OBJECT RECOGNITION;

C (PROGRAMMING LANGUAGE);

EID: 80054894097     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2011.27     Document Type: Article

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