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Volumn 415, Issue 1 SUPPL, 2011, Pages
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Video tracking and post-mortem analysis of dust particles from all tungsten ASDEX Upgrade
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Author keywords
[No Author keywords available]
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Indexed keywords
SILICON WAFERS;
TUNGSTEN;
CLASSIFICATION SCHEME;
ELEMENTAL COMPOSITIONS;
INDIVIDUAL PARTICLES;
LINEAR TRAJECTORY;
PARTICLE DENSITIES;
POST MORTEM ANALYSIS;
RESOURCE-EFFICIENT;
STATIONARY HOT SPOTS;
DUST;
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EID: 80054831624
PISSN: 00223115
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnucmat.2010.07.045 Document Type: Conference Paper |
Times cited : (28)
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References (15)
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