Accurate quantification of the Purcell effect in the presence of a dielectric microdisk of nanoscale thickness

Micro and Nano Letters

Volumn 6, Issue 6, 2011, Pages 393-396

  Balaban, M V ^a   Sauleau, R ^b   Benson, T M ^c   Nosich, A I ^a  

^a A USIKOV INSTITUTE OF RADIO PHYSICS AND ELECTRONICS   (Ukraine)

^b UNIVERSITÉ DE RENNES 1   (France)

^c UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

3D SOLUTIONS; COUPLED INTEGRAL EQUATIONS; FREDHOLM; KERNEL FUNCTION; LOCAL ENERGY; MAXWELL'S EQUATIONS; MICRODISKS; MOLECULAR DIPOLE; NANOSCALE THICKNESS; NONRADIATIVE DECAYS; NUMERICAL SOLUTION; PURCELL EFFECT; RADIATION CONDITION; REGULARISATION;

DECAY (ORGANIC); MAXWELL EQUATIONS; NUMERICAL METHODS;

INTEGRAL EQUATIONS;

NANOPARTICLE;

ACCURACY; ANALYSIS; ANALYTICAL EQUIPMENT; ANALYTICAL PARAMETERS; ARTICLE; DIELECTRIC MICRODISK; DIPOLE; PURCELL EFFECT; RADIATION; THICKNESS;

EID: 80054803897     PISSN: None     EISSN: 17500443     Source Type: Journal    
DOI: 10.1049/mnl.2011.0176     Document Type: Article

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