Forensic surface metrology: Tool mark evidence

Scanning

Volumn 33, Issue 5, 2011, Pages 272-278

  Gambino, Carol ^a,b   McLaughlin, Patrick ^a,c   Kuo, Loretta ^a   Kammerman, Frani ^a   Shenkin, Peter ^a   Diaczuk, Peter ^a,d   Petraco, Nicholas ^a,e,f   Hamby, James ^g   Petraco, Nicholas D K ^a,h  

^a JOHN JAY COLLEGE OF CRIMINAL JUSTICE   (United States)

^b CITY UNIVERSITY OF NEW YORK   (United States)

^c Government of New york   (United States)

^d PEDICO Research   (United States)

^e Petraco Forensic Consulting   (United States)

^f New York City Police Department Crime Laboratory   (United States)

^g International Forensic Science Laboratory   (United States)

^h CITY UNIVERSITY OF NEW YORK   (United States)

Author keywords

confocal microscopy; conformal prediction theory; firearms; forensic science; principle component analysis; statistics; support vector machine; surface metrology; tool marks

Indexed keywords

CONFORMAL PREDICTION THEORY; FIREARMS; FORENSIC SCIENCE; PRINCIPLE COMPONENT ANALYSIS; SUPPORT VECTOR; SURFACE METROLOGY; TOOL MARKS;

CONFOCAL MICROSCOPY; PRINCIPAL COMPONENT ANALYSIS; SUPPORT VECTOR MACHINES; UNITS OF MEASUREMENT;

EQUIPMENT;

ANALYTICAL ERROR; ARTICLE; CONFOCAL MICROSCOPY; CONFOCAL PREDICTION THEORY; FORENSIC SCIENCE; FORENSIC SURFACE METROLOGY; LEGAL EVIDENCE; MULTIVARIATE ANALYSIS; PREDICTION; PRINCIPAL COMPONENT ANALYSIS; PRIORITY JOURNAL; SUPPORT VECTOR MACHINE; SURFACE PROPERTY; THREE DIMENSIONAL IMAGING; TOOL MARK EVIDENCE; WEAPON; WHITE LIGHT;

ALGORITHMS; FIREARMS; FORENSIC MEDICINE; IMAGING, THREE-DIMENSIONAL; MICROSCOPY, CONFOCAL; PATTERN RECOGNITION, AUTOMATED; PRINCIPAL COMPONENT ANALYSIS; STATISTICS AS TOPIC; SUPPORT VECTOR MACHINES; SURFACE PROPERTIES;

EID: 80054738322     PISSN: 01610457     EISSN: 19328745     Source Type: Journal    
DOI: 10.1002/sca.20251     Document Type: Article

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