A dynamic stochastic analysis of international patent application and renewal processes

International Journal of Industrial Organization

Volumn 29, Issue 6, 2011, Pages 766-777

  Deng, Yi ^a  

^a UNIVERSITY OF SOUTH FLORIDA   (United States)

Author keywords

EPO; Patent application; Patent renewal

Indexed keywords

EPO; ESTIMATION RESULTS; INITIAL RETURNS; PATENT APPLICATIONS; PATENT HOLDERS; PATENT PROTECTION; PATENT RENEWAL; RENEWAL PROCESS; STOCHASTIC ANALYSIS;

DYNAMIC ANALYSIS; STOCHASTIC MODELS; STOCHASTIC SYSTEMS;

PATENTS AND INVENTIONS;

EID: 80054689973     PISSN: 01677187     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijindorg.2011.04.004     Document Type: Article

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