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Volumn 86, Issue 6-8, 2011, Pages 1125-1128

Determination of elemental depth profiles by multi-spot averaging technique of LIBS spectra

Author keywords

Compositional mapping; LIBS; Low Z coating; Plasma facing components; Signal background ratio

Indexed keywords

COMPOSITIONAL MAPPING; LIBS; LOW-Z COATING; PLASMA-FACING COMPONENTS; SIGNAL-BACKGROUND RATIO;

EID: 80054084877     PISSN: 09203796     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.fusengdes.2011.01.117     Document Type: Conference Paper
Times cited : (27)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.