Selective backscattered electron imaging of material and channeling contrast in microstructures of scale on low carbon steel controlled by accelerating voltage and take-off angle

ISIJ International

Volumn 51, Issue 9, 2011, Pages 1487-1491

  Aoyama, Tomohiro ^a   Nagoshi, Masayasu ^a   Nagano, Hideki ^a   Sato, Kaoru ^a   Tachibana, Shigeaki ^b  

^a JFE STEEL CORPORATION   (Japan)

^b SII NANOTECHNOLOGY INC   (Japan)

Author keywords

Accelerating voltage; Backscattered electron; Channeling contrast; Microstructure analysis; Scanning electron microscopy; Take off angle; Z contrast

Indexed keywords

ACCELERATING VOLTAGES; BACKSCATTERED ELECTRONS; CHANNELING CONTRAST; MICROSTRUCTURE ANALYSIS; SCANNING ELECTRONS; TAKE-OFF ANGLE;

BACKSCATTERING; BLIND SOURCE SEPARATION; ELECTRON SCATTERING; ELECTRONS; LOW CARBON STEEL; MATERIALS PROPERTIES; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY;

TAKEOFF;

EID: 80054084265     PISSN: 09151559     EISSN: None     Source Type: Journal    
DOI: 10.2355/isijinternational.51.1487     Document Type: Article

References (14)

1. H. Niedrig: Electron Beam Interaction with Solids for Microscopy, Microanalysis & Microlithography, ed. by D. F. Kyser et al., SEM Inc., AMF O'Hare, (1982), 51.
2. H. Niedrig: J. Appl. Phys., 53 (1982), R15.
3. R. Aurata: Scanning Microsc., 3 (1989), 736.
4. L. Reimer: Scanning Electron Microscopy, Springer-Verlag, Berlin Heidelberg, (1998).
5. K. Sato, S. Tachibana and K. Yamada: Collected Abstracts of the 2008 Autumn Meeting of The Japan Inst. of Metals, The Japan Institute of Metals, Sendai, Japan, (2008), 245.
6. A. Taniyama: Kenbikyou, 44 (2009), 16.
7. D. Berger and H. Niedrig: Scanning, 24 (2002), 70.
8. G. D. Archard: J. Appl. Phys., 32 (1961), 1505.
9. S. Tanuma, C. J. Powell and D. R. Penn: Surf. Interf. Anal., 21 (1993), 165.
10. M. Kotera, K. Murata and K. Nakagami: J. Appl. Phys., 52 (1981), 7403.
11. K. E. Hoffmann and H. Schmoranzer: Electron Beam Interaction with Solids for Microscopy, Microanalysis & Microlithography, ed. by D. F. Kyser et al., SEM Inc., AMF O'Hare, (1982), 209.
12. M. Nagoshi, K. Kawano and K. Sato: J. Surf. Finish. Soc. Jpn., 54 (2003), 31.
13. K. Sato, M. Nagoshi, K. Kawano and Y. Homma: Oyo-butsuri, 73 (2004), 1328.
14. K. Kawano, M. Nagoshi and K. Sato: JFE Tech. Rep., 13 (2006), 5.