Structural characterization and porosity analysis in self-supported porous alumina-silica thin films

Thin Solid Films

Volumn 520, Issue 1, 2011, Pages 30-34

  Tran, T H Y ^a   Schut, H ^a   Haije, W G ^a,b   Schoonman, J ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b TNO   (Netherlands)

Author keywords

Alumina; Fourier transform infrared spectroscopy; Nitrogen; Physisorption; Positron Doppler broadening analysis; Silica; Sol gel; X ray diffraction

Indexed keywords

ADSORBED CO; ALUMINA-SILICA; ANNIHILATION PHOTONS; BINARY MATERIALS; FOURIER TRANSFORM INFRARED; FTIR; GAS SEPARATION MEMBRANE; MEMBRANE PRODUCTION; MESOPOROUS; MICROPOROUS; POROUS FILM; POROUS SUPPORT; POSITRON ANNIHILATION TECHNIQUE; SOL-GEL TECHNIQUE; STRUCTURAL CHARACTERIZATION;

DIFFRACTION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GELS; MICROPOROSITY; PHYSISORPTION; POSITRON ANNIHILATION SPECTROSCOPY; POSITRONS; SILICA; SOL-GEL PROCESS; SOL-GELS; SOLS; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

GAS PERMEABLE MEMBRANES;

EID: 80054036361     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2011.06.027     Document Type: Article

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