|
Volumn 65-66, Issue 1, 2011, Pages 211-218
|
Visible and NIR integrated Phototransistors in CMOS technology
|
Author keywords
CMOS; Light detector; OEIC; Phototransistor; SoC
|
Indexed keywords
3D CAMERA;
BASE DOPING PROFILE;
CMOS;
CMOS PROCESSS;
CMOS TECHNOLOGY;
EMITTER AREA;
FULLY INTEGRATED;
HIGH BANDWIDTH;
HIGHLY SENSITIVE;
MODULATED LIGHT;
OPTICAL DISTANCE MEASUREMENTS;
RESPONSIVITY;
SILICON CMOS;
SOC;
SYSTEMS-ON-A-CHIP;
BANDWIDTH;
CMOS INTEGRATED CIRCUITS;
DOPING (ADDITIVES);
INTEGRATED OPTOELECTRONICS;
INTEGRATION;
PROGRAMMABLE LOGIC CONTROLLERS;
SILICON WAFERS;
PHOTOTRANSISTORS;
|
EID: 80054010394
PISSN: 00381101
EISSN: None
Source Type: Journal
DOI: 10.1016/j.sse.2011.06.009 Document Type: Conference Paper |
Times cited : (5)
|
References (13)
|