TIR illumination technology for defect inspection of plastic ophthalmic lenses

Guangxue Jingmi Gongcheng/Optics and Precision Engineering

Volumn 19, Issue 9, 2011, Pages 2247-2254

  Zhao, Li Ping ^a   Li, Xiang ^a   Fang, Zhong Ping ^a  

^a Singapore Institute of Planners   (Singapore)

Author keywords

Defect inspection; Machine vision; Plastic ophthalmic lens; Total Internal Reflection(TIR)

Indexed keywords

DARK-FIELD; DEFECT INSPECTION; ILLUMINATION TECHNOLOGY; INSPECTION TECHNIQUE; MANUAL INSPECTION; OPHTHALMIC LENS; OPTICAL SURFACES; TESTING RESULTS; TOTAL INTERNAL REFLECTIONS;

COMPUTER VISION; DEFECTS; PLASTIC LENSES; REFRACTIVE INDEX;

INSPECTION;

EID: 80054000084     PISSN: 1004924X     EISSN: None     Source Type: Journal    
DOI: 10.3788/OPE.20111909.2247     Document Type: Article

References (5)

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5. VAEZ-IRAVANI. Defect detection system US Patent 6, 862, 096 [P]. 2005-03-01.