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Volumn 324, Issue 3, 2012, Pages 314-320
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The potential of bit patterned media in shingled recording
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Author keywords
Bit patterned media; Composite media; Shingled recording
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Indexed keywords
AREAL DENSITIES;
BIT-PATTERNED MEDIA;
COMPOSITE MEDIA;
CONTINUOUS MEDIA;
DOT UNIFORMITY;
MANUFACTURING TOLERANCES;
SHINGLED RECORDING;
TRANSITION NOISE;
NANOIMPRINT LITHOGRAPHY;
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EID: 80053593771
PISSN: 03048853
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jmmm.2010.12.017 Document Type: Conference Paper |
Times cited : (1)
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References (8)
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