|
Volumn 21, Issue 40, 2011, Pages 15895-15898
|
Germanium nanocrystal doped inverse crystalline silicon opal
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CONDUCTIVITY MEASUREMENTS;
CRYSTALLINE SILICONS;
DOPING LEVELS;
GERMANIUM NANOCRYSTALS;
HYBRID PHOTONIC CRYSTALS;
OPTICAL AND ELECTRICAL PROPERTIES;
CRYSTALLINE MATERIALS;
ELECTRIC PROPERTIES;
NANOCRYSTALS;
PHOTONIC CRYSTALS;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
GERMANIUM;
|
EID: 80053545118
PISSN: 09599428
EISSN: 13645501
Source Type: Journal
DOI: 10.1039/c1jm13172a Document Type: Article |
Times cited : (15)
|
References (32)
|