Pixel quality evaluation and correction procedures in electronic speckle pattern interferometry

Experimental Techniques

Volumn 35, Issue 5, 2011, Pages 23-29

  An, Y ^a   Schajer, G S ^a  

^a UNIVERSITY OF BRITISH COLUMBIA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ADJACENT PIXELS; COHERENT LIGHT BEAMS; CORRECTION PROCEDURE; ELECTRONIC SPECKLE PATTERN INTERFEROMETRY; LIGHT BEAM; PHASE ANGLES; PIEZO ACTUATOR; QUALITY EVALUATION; SPECKLE PATTERNS; SURFACE DISPLACEMENT;

INTERFEROMETRY; QUALITY CONTROL; SPECKLE;

PIXELS;

EID: 80053510718     PISSN: 07328818     EISSN: 17471567     Source Type: Journal    
DOI: 10.1111/j.1747-1567.2010.00621.x     Document Type: Article

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