Micromagnetic specification for bit patterned recording at 4 Tbit/in 2

IEEE Transactions on Magnetics

Volumn 47, Issue 10, 2011, Pages 2652-2655

  Dong, Yan ^a   Victora, R H ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

Author keywords

Bit error rate; bit patterned media; exchange coupled composite (ECC) media; micromagnetic simulation

Indexed keywords

ERRORS; MAGNETIC DISK STORAGE; SPECIFICATIONS;

AREAL DENSITIES; BIT-PATTERNED MEDIA; DEMAGNETIZING FIELD; EXCHANGE COUPLED COMPOSITE MEDIA; FIELD GRADIENT; MICROMAGNETIC SIMULATIONS; SHIELDING EFFECT; SWITCHING FIELD DISTRIBUTION;

BIT ERROR RATE;

EID: 80053504818     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2011.2148112     Document Type: Article

References (5)

1. H. J. Richter et al., "Recording in bit-patterned media at densities of 1 Tb/in and beyond," IEEE Trans. Magn., vol. 42, no. 10, pp. 2255-2260, Oct. 2006.
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5. P. W. Nutter, I. T. Ntokas, and B. K. Middleton, "An investigation of the effects of media characteristics on read channel performance for patterned media storage," IEEE Trans. Magn., vol. 41, no. 11, pp. 4327-4334, Nov. 2005.