New method for determining the depth of field of microscope systems

Applied Optics

Volumn 50, Issue 28, 2011, Pages 5524-5533

  Chen, Xiaodong ^a,b   Ren, Liqiang ^a   Qiu, Yuchen ^b   Liu, Hong ^b  

^a TIANJIN UNIVERSITY   (China)

^b University of Oklahoma   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL DEVICES; FOCUSING;

DIFFRACTION OPTICS; DIGITAL MICROSCOPES; LIGHT WAVELENGTHS; MICROSCOPE SYSTEMS; NUMERICAL APERTURE; OPERATING CONDITION; OPTICAL MICROSCOPES; SYSTEM COMPONENTS;

MICROSCOPES;

ACCOMMODATION; ARTICLE; COMPARATIVE STUDY; EVALUATION; HUMAN; IMAGE PROCESSING; INSTRUMENTATION; LIGHT RELATED PHENOMENA; MICROSCOPY; OPTICAL INSTRUMENTATION; STATISTICS;

ACCOMMODATION, OCULAR; HUMANS; IMAGE PROCESSING, COMPUTER-ASSISTED; LENSES; MICROSCOPY; OPTICAL DEVICES; OPTICAL PHENOMENA;

EID: 80053429169     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.50.005524     Document Type: Article

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