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Volumn , Issue , 2010, Pages 17-25
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New advances in sequential diagnosis
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Author keywords
[No Author keywords available]
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Indexed keywords
CLONE CELLS;
LARGE SYSTEM;
MEASUREMENT POINT SELECTION;
MEASUREMENT POINTS;
MEASUREMENTS OF;
SEQUENTIAL DIAGNOSIS;
KNOWLEDGE REPRESENTATION;
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EID: 80053391581
PISSN: 23341025
EISSN: 23341033
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (2)
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References (17)
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