Random projection for dimensionality reduction-Applied to time-of-flight secondary ion mass spectrometry data

Analytica Chimica Acta

Volumn 705, Issue 1-2, 2011, Pages 48-55

  Varmuza, Kurt ^a   Engrand, Cécile ^b   Filzmoser, Peter ^a   Hilchenbach, Martin ^c   Kissel, Jochen ^c   Krüger, Harald ^c   Silén, Johan ^d   Trieloff, Mario ^e  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b UNIVERSITÉ PARIS SACLAY   (France)

^c MAX PLANCK INSTITUT FÜR SONNENSYSTEMFORSCHUNG   (Germany)

^d FINNISH METEOROLOGICAL INSTITUTE   (Finland)

^e UNIVERSITY OF HEIDELBERG   (Germany)

Author keywords

Chemometrics; Minerals; Projection; Simulation; Time of flight secondary ion mass spectrometry

Indexed keywords

FLIGHT SIMULATORS; IONS; MINERALS; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY;

AUTOMATIC RECOGNITION; CHEMOMETRICS; DIMENSIONALITY REDUCTION; HARDWARE RESTRICTIONS; PROJECTION; SECONDARY ION MASS SPECTROMETERS; SIMULATION; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY;

DATA REDUCTION;

CLINOPYROXENE; MINERAL; OLIVINE; PYRITE; UNCLASSIFIED DRUG;

ALGORITHM; ANALYTICAL PARAMETERS; ARTICLE; CHEMOMETRICS; COMPUTER; CONTROLLED STUDY; DATA ANALYSIS; MATHEMATICAL PARAMETERS; PRIORITY JOURNAL; RANDOM PROJECTION; TIME OF FLIGHT MASS SPECTROMETRY; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY;

EID: 80053386155     PISSN: 00032670     EISSN: 18734324     Source Type: Journal    
DOI: 10.1016/j.aca.2011.03.031     Document Type: Article

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