New lens-free X-ray source for laboratory nano-CT with 50-nm spatial resolution

AIP Conference Proceedings

Volumn 1365, Issue , 2010, Pages 140-143

  Sasov, A ^a   Pauwels, B ^a   Bruyndonckx, P ^a   Liu, X ^a  

^a SkyScan   (Belgium)

Author keywords

depth of focus; microtomography; nanotomography; spatial resolution; X ray source

Indexed keywords

EID: 80053300046     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3625324     Document Type: Conference Paper

References (6)

1. Y.S. Chu, Appl. Phys. Lett. 92, 103119 (2008).
2. Y. Suzuki, SPring-8 summer school (2008).
3. G. Goldstein et al., Scanning Electron Microscopy and X-Ray Microanalysis, Springer, ISBN 0306472929 (2003).
4. http://www.skyscan.be/products/SEM-microCT.htm
5. B. Pauwels, X. Liu, and A. Sasov, Proc. SPIE 7804 (2010).
6. A. Sasov, X. Liu and P. Salmon, Proc. SPIE 7078, 70781C.1-70781C.9 (2008).