Regression-based models to predict rice leaf area index using biennial fixed point continuous observations of near infrared digital images

Plant Production Science

Volumn 14, Issue 4, 2011, Pages 365-376

  Shibayama, Michio ^a   Sakamoto, Toshihiro ^a   Takada, Eiji ^b   Inoue, Akihiro ^b   Morita, Kazuhiro ^c   Yamaguchi, Takuya ^c   Takahashi, Wataru ^c   Kimura, Akihiko ^d  

^a NATIONAL INSTITUTE FOR AGRO ENVIRONMENTAL SCIENCES   (Japan)

^b TOYAMA NATIONAL COLLEGE OF TECHNOLOGY   (Japan)

^c Toyama Agricultural Research Center   (Japan)

^d Kimura OyoKogei Inc   (Japan)

Author keywords

Digital camera; Leaf area index; Near infrared; Refl ectance factor; Rice

Indexed keywords

EID: 80053192530     PISSN: 1343943X     EISSN: 13491008     Source Type: Journal    
DOI: 10.1626/pps.14.365     Document Type: Article

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