SCORE: A scalable concolic testing tool for reliable embedded software

SIGSOFT/FSE 2011 - Proceedings of the 19th ACM SIGSOFT Symposium on Foundations of Software Engineering

Volumn , Issue , 2011, Pages 420-423

  Kim, Yunho ^a   Kim, Moonzoo ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

C PROGRAMS; DESIGN DECISIONS; INDUSTRIAL TESTING; MAIN TASKS; RUNTIMES; TEST CASE; TESTING TOOLS;

C (PROGRAMMING LANGUAGE); CONCRETE TESTING; EMBEDDED SOFTWARE; INSTRUMENT TESTING; SOFTWARE ENGINEERING;

SOFTWARE TESTING;

EID: 80053181320     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/2025113.2025180     Document Type: Conference Paper

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