메뉴 건너뛰기




Volumn 67, Issue 5, 2011, Pages 416-424

Effects of the [OC 6F 5] moiety upon structural geometry: Crystal structures of half-sandwich tantalum(V) aryloxide complexes from reaction of Cp*Ta(N tBu)(CH 2 R) 2 with pentafluorophenol

Author keywords

agostic interactions; pentamethylcyclopentadienyltantalum imido complexes

Indexed keywords

AGOSTIC INTERACTIONS; ARYLOXIDE; ARYLOXIDE COMPLEXES; ELECTRONIC FACTORS; ELECTRONIC STABILITY; ELECTRONWITHDRAWING; HALF-SANDWICH; IMIDO COMPLEXES; ORBITALS; PENTAFLUOROPHENYL; PENTAMETHYLCYCLOPENTADIENYL; PENTAMETHYLCYCLOPENTADIENYLTANTALUM IMIDO COMPLEXES; STERIC CONGESTION; STRUCTURAL CHARACTERIZATION; STRUCTURAL GEOMETRY; TETRAKIS; TWIST ANGLES;

EID: 80053081053     PISSN: 01087681     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108768111029259     Document Type: Article
Times cited : (5)

References (36)
  • 10
    • 80053088014 scopus 로고
    • CCDC. Cambridge Crystallographic Data Centre 12 Union Road, Cambridge, UK
    • CCDC (1994). Vista. Cambridge Crystallographic Data Centre, 12 Union Road, Cambridge, UK.
    • (1994) Vista
  • 20
    • 0000443799 scopus 로고
    • edited by L. Paquette. New York: Pergamon Press
    • Negishi, E. (1991). Comprehensive Organic Synthesis, edited by L. Paquette, Vol. 5, p. 1163. New York: Pergamon Press.
    • (1991) Comprehensive Organic Synthesis , vol.5 , pp. 1163
    • Negishi, E.1
  • 28
    • 80053071761 scopus 로고
    • Siemens Analytical X-ray Instruments, Version 2.1. Siemens Analytical X-ray Instruments, Inc., Madison, Wisconsin, USA
    • Siemens Analytical X-ray Instruments (1994). XSCANS, Version 2.1. Siemens Analytical X-ray Instruments, Inc., Madison, Wisconsin, USA.
    • (1994) XSCANS
  • 29
    • 80053090514 scopus 로고
    • Siemens Analytical X-ray Instruments, Version 4.050. Siemens Analytical X-ray Instruments, Inc., Madison, Wisconsin, USA
    • Siemens Analytical X-ray Instruments (1995a). SMART, Version 4.050. Siemens Analytical X-ray Instruments, Inc., Madison, Wisconsin, USA.
    • (1995) SMART
  • 30
    • 80053054467 scopus 로고
    • Siemens Analytical X-ray Instruments, Version 4.050. Siemens Analytical X-ray Instruments, Inc., Madison, Wisconsin, USA
    • Siemens Analytical X-ray Instruments (1995b). SAINT, Version 4.050. Siemens Analytical X-ray Instruments, Inc., Madison, Wisconsin, USA.
    • (1995) SAINT


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.