Uncooled detector development at Raytheon

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8012, Issue , 2011, Pages

  Black, S H ^a   Sessler, T ^a   Gordon, E ^a   Kraft, R ^a   Kocian, T ^a   Lamb, M ^a   Williams, R ^a   Yang, T ^a  

^a RAYTHEON COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATED PACKAGING; DEFECTIVITY; DEVELOPMENT STRATEGIES; FREESCALE; FREESCALE SEMICONDUCTORS; HIGH RATE; MANUFACTURING CAPABILITY; PRODUCT-LINES; PROGRAM PLAN; RAYTHEON; SUB-FIELD STITCHING; TEST CAPABILITY; UNCOOLED DETECTORS; UNCOOLED SENSORS; WAFER FAB;

CHIP SCALE PACKAGES; DETECTORS;

INFRARED RADIATION;

EID: 80053033624     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.887816     Document Type: Conference Paper

References (0)