NbVO5 mesoporous thin films by evaporation induced micelles packing: Pore size dependence of the mechanical stability upon thermal treatment and Li insertion/extraction

Chemistry of Materials

Volumn 23, Issue 18, 2011, Pages 4124-4131

  Krins, Natacha ^a,b   Bass, John D ^b   Grosso, David ^b   Henrist, Catherine ^a   Delaigle, Romain ^c   Gaigneaux, Eric M ^c   Cloots, Rudi ^a   Vertruyen, Bénédicte ^a   Sanchez, Clément ^b  

^a UNIVERSITY OF LIÈGE   (Belgium)

^b UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

^c UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

Author keywords

cyclic voltammetry; electron tomography; in situ thermal ellipsometry analysis; Li battery; Mesoporous thin film; NbVO5; self assembling

Indexed keywords

ELECTRON TOMOGRAPHY; IN SITU THERMAL ELLIPSOMETRY ANALYSIS; LI BATTERY; MESOPOROUS THIN FILMS; NBVO5; SELF-ASSEMBLING;

ATOMIC FORCE MICROSCOPY; BLOCK COPOLYMERS; CRYSTALLIZATION; ELECTRIC IMPEDANCE TOMOGRAPHY; ELLIPSOMETRY; FILM PREPARATION; FILM THICKNESS; LITHIUM; MECHANICAL STABILITY; MESOPOROUS MATERIALS; MICELLES; MULTILAYER FILMS; NETWORK ARCHITECTURE; PHASE TRANSITIONS; PORE SIZE; STRESSES; SURFACE ACTIVE AGENTS; THERMAL EVAPORATION; THIN FILMS; TRANSITION METAL COMPOUNDS; TRANSITION METALS; TRANSMISSION ELECTRON MICROSCOPY; WALLS (STRUCTURAL PARTITIONS);

CYCLIC VOLTAMMETRY;

EID: 80052981866     PISSN: 08974756     EISSN: 15205002     Source Type: Journal    
DOI: 10.1021/cm103481n     Document Type: Article

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