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Volumn 509, Issue 41, 2011, Pages 9996-10002
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Microstructure and properties of SiO2 matrix reinforced by BN nanotubes and nanoparticles
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Author keywords
BNNPs; BNNTs; Dielectrics constant; Mechanical properties; Microstructure; SiO2
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Indexed keywords
BN NANOTUBE;
BNNPS;
BNNTS;
BORON NITRIDE NANOTUBES;
FIELD EMISSION SCANNING ELECTRON MICROSCOPY;
HEXAGONAL BORON NITRIDE (H-BN);
LOW DIELECTRIC CONSTANTS;
MATRIX;
MICROSTRUCTURE AND PROPERTIES;
NITRIDE NANOPARTICLES;
RELATIVE DENSITY;
SIO2;
BORON;
BORON NITRIDE;
DENSITY (SPECIFIC GRAVITY);
DIELECTRIC MATERIALS;
FIELD EMISSION MICROSCOPES;
FRACTURE MECHANICS;
MECHANICAL PROPERTIES;
MICROSTRUCTURE;
NANOPARTICLES;
NANOTUBES;
NITRIDES;
SCANNING ELECTRON MICROSCOPY;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
SILICON COMPOUNDS;
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EID: 80052964793
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2011.08.010 Document Type: Article |
Times cited : (25)
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References (26)
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