Electrical failure behaviors of semiconductor oxide nanowires

Nanotechnology

Volumn 22, Issue 40, 2011, Pages

  Nie, Anmin ^a   Liu, Jiabin ^a   Dong, Cezhou ^a   Wang, Hongtao ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BONDING NATURE; CORE SHELL STRUCTURE; COVALENTLY BONDED; CURRENT LEADS; DECOMPOSITION PROCESS; ELECTRICAL FAILURES; ENHANCED FIELD EMISSION; HIGH-ASPECT-RATIO TIPS; IN-SITU; IONIC BONDING; NEEDLE-LIKE; OXYGEN IONS; SEMICONDUCTOR OXIDES; TIO; TRANSMISSION ELECTRON MICROSCOPE;

ASPECT RATIO; MELTING; STOICHIOMETRY; TITANIUM; TITANIUM DIOXIDE; TRANSMISSION ELECTRON MICROSCOPY;

NANOWIRES;

EID: 80052931205     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/40/405703     Document Type: Article

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