Novel nanocrystalline Gd2O3(Eu) scintillator screens with a micro-pixel structure for high spatial resolution X-ray imaging

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 652, Issue 1, 2011, Pages 717-720

  Cha, Bo Kyung ^a   Lee, Seung Jun ^b   Muralidharan, P ^b   Kim, Do Kyung ^b   Kim, Jong Yul ^b   Cho, Gyuseong ^b   Jeon, Sungchae ^a   Huh, Young ^a  

^a Korea Electrotechnology Research Institute (KERI)   (South Korea)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

Nanocrystalline Gd2O3:Eu scintillator; Pixelated scintillator; Spatial resolution; X ray imaging detector

Indexed keywords

CALCINATION TREATMENT; CHARGE COUPLED DEVICE CAMERA; DEEP REACTIVE ION ETCHING; HIGH SPATIAL RESOLUTION; HYDROTHERMAL METHODS; LIGHT INTENSITY; LIGHT RESPONSE; MICRO-PIXEL; NANOCRYSTALLINE GD2O3:EU SCINTILLATOR; NANOCRYSTALLINES; OPTICAL PHOTONS; PIXEL SIZE; PIXEL STRUCTURE; PIXELATED SCINTILLATOR; SILICON ARRAYS; SILICON STRUCTURES; SILICON-BASED; SPATIAL RESOLUTION; STANDARD PHOTOLITHOGRAPHY; STRUCTURE-BASED; VISIBLE LIGHT; X-RAY IMAGING DETECTOR; X-RAY SOURCES; XRAY IMAGING;

CALCINATION; CHARGE COUPLED DEVICES; EUROPIUM; GADOLINIUM; IMAGE RESOLUTION; LIGHT; LIGHT EMISSION; MICROCRYSTALLINE SILICON; MULTIPHOTON PROCESSES; NANOCRYSTALLINE SILICON; OPTICAL TRANSFER FUNCTION; PHOSPHORS; PHOTOLITHOGRAPHY; REACTIVE ION ETCHING; SCINTILLATION; SCINTILLATION COUNTERS; X RAY ANALYSIS; X RAYS;

PIXELS;

EID: 80052930517     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2011.01.024     Document Type: Conference Paper

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