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Volumn , Issue , 2011, Pages 2601-2608

A scalable dual approach to semidefinite metric learning

Author keywords

[No Author keywords available]

Indexed keywords

PATTERN RECOGNITION;

EID: 80052905593     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2011.5995447     Document Type: Conference Paper
Times cited : (28)

References (24)
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    • B. Borchers. CSDP, a C library for semidefinite programming. Optim. Methods and Softw., 11(1):613-623, 1999.
    • (1999) Optim. Methods and Softw. , vol.11 , Issue.1 , pp. 613-623
    • Borchers, B.1
  • 9
    • 51849117118 scopus 로고    scopus 로고
    • Labeled faces in the wild: A database for studying face recognition in unconstrained environments
    • University of Massachusetts, Amherst, October
    • G. B. Huang, M. Ramesh, T. Berg, and E. Learned-Miller. Labeled faces in the wild: A database for studying face recognition in unconstrained environments. Technical Report 07-49, University of Massachusetts, Amherst, October 2007.
    • (2007) Technical Report 07-49
    • Huang, G.B.1    Ramesh, M.2    Berg, T.3    Learned-Miller, E.4
  • 11
    • 33646887390 scopus 로고
    • On the limited memory BFGS method for large scale optimization
    • D. C. Liu and J. Nocedal. On the limited memory BFGS method for large scale optimization. Math. Program.: Series A and B, 45(3):503-528, 1989.
    • (1989) Math. Program.: Series A and B , vol.45 , Issue.3 , pp. 503-528
    • Liu, D.C.1    Nocedal, J.2
  • 12
    • 3042535216 scopus 로고    scopus 로고
    • Distinctive image features from scale-invariant keypoints
    • D. G. Lowe. Distinctive image features from scale-invariant keypoints. Int. J. Comp. Vis., 60(2):91-110, 2004.
    • (2004) Int. J. Comp. Vis. , vol.60 , Issue.2 , pp. 91-110
    • Lowe, D.G.1
  • 14
    • 70450172604 scopus 로고    scopus 로고
    • How far can you get with a modern face recognition test set using only simple features?
    • N. Pinto, J. DiCarlo, and D. Cox. How far can you get with a modern face recognition test set using only simple features? In Proc. IEEE Conf. Comp. Vis. Pattern Recogn., 2009.
    • (2009) Proc. IEEE Conf. Comp. Vis. Pattern Recogn.
    • Pinto, N.1    DiCarlo, J.2    Cox, D.3
  • 17
    • 84937544784 scopus 로고    scopus 로고
    • Adjustment learning and relevant component analysis
    • London, UK, Springer-Verlag
    • N. Shental, T. Hertz, D. Weinshall, and M. Pavel. Adjustment learning and relevant component analysis. In Proc. Euro. Conf. Comp. Vis., volume 4, pages 776-792, London, UK, 2002. Springer-Verlag.
    • (2002) Proc. Euro. Conf. Comp. Vis. , vol.4 , pp. 776-792
    • Shental, N.1    Hertz, T.2    Weinshall, D.3    Pavel, M.4
  • 20
    • 61749090884 scopus 로고    scopus 로고
    • Distance metric learning for large margin nearest neighbor classification
    • K. Q. Weinberger, J. Blitzer, and L. K. Saul. Distance metric learning for large margin nearest neighbor classification. J. Mach. Learn. Res., 10:207-244, 2009.
    • (2009) J. Mach. Learn. Res. , vol.10 , pp. 207-244
    • Weinberger, K.Q.1    Blitzer, J.2    Saul, L.K.3
  • 21
    • 33744949513 scopus 로고    scopus 로고
    • Unsupervised learning of image manifolds by semidefinite programming
    • K. Q. Weinberger and L. K. Saul. Unsupervised learning of image manifolds by semidefinite programming. Int. J. Comp. Vis., 70(1):77-90, 2005.
    • (2005) Int. J. Comp. Vis. , vol.70 , Issue.1 , pp. 77-90
    • Weinberger, K.Q.1    Saul, L.K.2
  • 24
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    • Distance metric learning, with application to clustering with side-information
    • MIT Press
    • E. Xing, A. Ng, M. Jordan, and S. Russell. Distance metric learning, with application to clustering with side-information. In Proc. Adv. Neural Inf. Process. Syst. MIT Press, 2002.
    • (2002) Proc. Adv. Neural Inf. Process. Syst.
    • Xing, E.1    Ng, A.2    Jordan, M.3    Russell, S.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.