High energy-resolution zero-degree facility for light-ion scattering and reactions at iThemba LABS

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 654, Issue 1, 2011, Pages 29-39

  Neveling, R ^a   Fujita, H ^a,b,c   Smit, F D ^a   Adachi, T ^c,i   Berg, G P A ^d   Buthelezi, E Z ^a   Carter, J ^b   Conradie, J L ^a   Couder, M ^d   Fearick, R W ^e   Fortsch S V ^a   Fourie, D T ^a   Fujita, Y ^c   Gorres J ^d   Hatanaka, K ^c   Jingo, M ^b   Krumbholz, A M ^f   Kureba, C O ^b   Mira, J P ^g   Murray, S H T ^a   Von Neumann Cosel, P ^f   Obrien, S ^d   Papka, P ^a,g   Poltoratska, I ^f   Richter, A ^f,h   Sideras Haddad, E ^b   Swartz, J A ^g   Tamii, A ^c   Usman, I T ^b   Van Zyl, J J ^g   more..

^a ITHEMBA LABS   (South Africa)

^b UNIVERSITY OF THE WITWATERSRAND   (South Africa)

^c OSAKA UNIVERSITY   (Japan)

^d UNIVERSITY OF NOTRE DAME   (United States)

^e UNIVERSITY OF CAPE TOWN   (South Africa)

^f DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^g STELLENBOSCH UNIVERSITY   (South Africa)

^h ECT   (Italy)

ⁱ UNIVERSITY OF GRONINGEN   (Netherlands)

Author keywords

(p,t) reaction; Dispersion matching; Faint beam technique; Inelastic proton scattering; Measurement at 0 ; Particle decay

Indexed keywords

(P,T) REACTION; BACKGROUND SUBTRACTION; BACKWARD SCATTERING; BEAM PARTICLES; DOUBLE-SIDED SILICON STRIP DETECTORS; ENERGY RESOLUTIONS; EXPERIMENTAL TECHNIQUES; FAINT BEAM TECHNIQUE; INCIDENT ENERGY; LIGHT IONS; LOW BACKGROUND; MAGNETIC RIGIDITY; MAGNETIC SPECTROMETERS; PARTICLE-DECAY; PROTON SCATTERING; SCATTERING ANGLES;

DISPERSIONS; EXCITATION ENERGY; HIGH ENERGY PHYSICS; LEAD; PROTONS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICON DETECTORS;

SCATTERING;

EID: 80052895715     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2011.06.077     Document Type: Article

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