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Volumn 654, Issue 1, 2011, Pages 634-638
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Notes on Van der Meer scan for absolute luminosity measurement
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Author keywords
Beam imaging; Luminosity; Van der Meer scan
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Indexed keywords
ABSOLUTE LUMINOSITY;
ARBITRARY BEAMS;
BEAM IMAGING;
LUMINOSITY MEASUREMENT;
SCAN-PLANES;
SIMPLE METHOD;
TRANSVERSE PLANES;
VAN DER MEER SCAN;
LUMINANCE;
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EID: 80052881358
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2011.06.007 Document Type: Article |
Times cited : (21)
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References (12)
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