A deformation and lighting insensitive metric for face recognition based on dense correspondences

Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition

Volumn , Issue , 2011, Pages 2353-2360

  Jorstad, Anne ^a   Jacobs, David ^a   Trouvé, Alain ^b  

^a UNIVERSITY OF MARYLAND   (United States)

^b Inserm   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DEFORMATION; IMAGE ENHANCEMENT; LIGHTING;

DENSE CORRESPONDENCES; EXPRESSION VARIATIONS; FACE DATABASE; FACE IMAGES; NAVE BAYES CLASSIFIERS; RECOGNITION ACCURACY; SINGLE MODELS;

FACE RECOGNITION;

EID: 80052877361     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2011.5995431     Document Type: Conference Paper

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