From partial shape matching through local deformation to robust global shape similarity for object detection

Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition

Volumn , Issue , 2011, Pages 1441-1448

  Ma, Tianyang ^a   Latecki, Longin Jan ^a  

^a Temple University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GRAPHIC METHODS; OBJECT RECOGNITION; PATTERN MATCHING;

AFFINE TRANSFORMATIONS; CLUTTERED BACKGROUNDS; CONTOUR LOCALIZATION; CONTOUR-BASED OBJECT DETECTIONS; LOCAL DEFORMATIONS; PARTIAL SHAPE MATCHING; PRECISE LOCATIONS; SHAPE REPRESENTATION;

OBJECT DETECTION;

EID: 80052874531     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2011.5995591     Document Type: Conference Paper

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