Use of stochastic methods for robust parameter extraction from impedance spectra

Electrochimica Acta

Volumn 56, Issue 23, 2011, Pages 8069-8077

  Büschel, Paul ^a   Tröltzsch, Uwe ^a   Kanoun, Olfa ^a  

^a CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Automated parameter extraction; Evolution; Particle filter; Simulated annealing

Indexed keywords

AUTOMATED PARAMETER EXTRACTION; AUTOMATIC MEASUREMENT SYSTEM; BATTERY MODELS; EVOLUTION; FAST MEASUREMENT; ILL POSED; IMPEDANCE MODELS; IMPEDANCE SPECTROSCOPY; IMPEDANCE SPECTRUM; LIMITING FACTORS; LOCAL MINIMUMS; MEASURED DATA; NOISY MEASUREMENT DATA; NON-LINEAR MODEL; NONLINEAR BEHAVIOR; PARTICLE FILTER; REFERENCE MODELS; SEARCH SPACES; STOCHASTIC ALGORITHMS; STOCHASTIC METHODS; UNKNOWN PARAMETERS;

ALGORITHMS; MEASUREMENTS; NONLINEAR FILTERING; PARAMETER EXTRACTION; SIMULATED ANNEALING; STOCHASTIC SYSTEMS;

STOCHASTIC MODELS;

EID: 80052714055     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2011.01.047     Document Type: Conference Paper

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