Integrated circuit security techniques using variable supply voltage

Proceedings - Design Automation Conference

Volumn , Issue , 2011, Pages 248-253

  Wei, Sheng ^a   Potkonjak, Miodrag ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Gate level characterization; integrated circuit security; process variation; supply voltage control

Indexed keywords

COMPUTER AIDED DESIGN; HARDWARE SECURITY; TIMING CIRCUITS;

FALSE NEGATIVES; FALSE POSITIVE; GATE-LEVEL CHARACTERIZATIONS; PHYSICAL LEVEL; PROCESS VARIATION; SECURITY ISSUES; SUPPLY VOLTAGES; VARIABLE SUPPLY VOLTAGES;

INTEGRATED CIRCUITS;

EID: 80052656400     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/2024724.2024781     Document Type: Conference Paper

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